PRODUCT > ESD/TLP 1 페이지

ESD/EFT/서지

EMI Receiver

ESD/TLP

절연/부품시험

Total 3

Precision Micromanipulator Kit for TLP/VF-TLP Wafer-Level Measurements PHD-3001A

Pulse force and pulse sense RF probing solution for TLP/VF-TLP/HMM on-wafer measurements

High peak current capability 80 A (100 ns)

DC - 7 GHz bandwidth

Isolated probe-head ground shield for high pulse sense common mode signal rejection

True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment

Portable Wafer Probe Station PS-5026A

Portable manual wafer probe station

Electrically isolated chuck with vacuum interface and wafer backside potential connector

80x trinocular stereo zoom microscope

Ultra long-life 20000 lx white LED ring light

High reliability

Low cost

CC-TLP

The CC-TLP-50-A1 probearm is used for CC-TLP measurements
in order to investigate the CDM performance
of the device under test [1], [2], [3], [4], [5]. For
that purpose the TLP pulse has to have a pulse width
less than 1 ns and a rise time of about typical 100 ps.
DUT voltage and current have to be measured using a
vf-TLP setup.