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TLP-4010C / 3011C
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TLP/VF-TLP/HMM Test System
The universal TLP/VF-TLP/HMM test system TLP-4010C/3011C offers advanced features intended for the characterization of circuits, semiconductor devices and discretes like TVS, varistors, capacitors, in the high power time domain.
Features
• Wafer and package level TLP/VF-TLP/HMM testing
• Ultra fast 50Ω high voltage pulse output with typical
100 ps rise time
• Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV
• High pulse output current up to ±40 A
• High speed 50Ω trigger output for oscilloscopes (synchronous
to high voltage pulse output)
• 6 programmable pulse rise times: 100 ps to 50 ns
• 8 (optional 9) programmable pulse widths: 0.5 ns (optional),
1 ns to 100 ns
• Optional pulse width extender increases pulse width up
to 1.6 μs in 68 programmable steps
• Fast measurement time, typically 0.2 s per pulse including
one-point DC measurement between pulses
• Efficient software for system control and waveform data
management
• The software can control automatic probers (Suss) for
fast measurement of complete wafers
• High performance and high quality components
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TLP-8010C
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80A TLP/VF-TLP/HMM Test System
The high-current TLP/VF-TLP/HMM test system TLP-8010C combines the performance of the TLP-8010A and TLP-4010C system.
Features
• Wafer, package and system level TLP, VF-TLP and HMM
testing
• Combines TLP-8010A and TLP-4010C into one
system
• Can be operated together with TLP-8012A5 and TLP-
3011C pulse width extenders
• Ultra fast 50Ω high voltage pulse output with typical rise
time 100 ps (0 A to 40 A) and 300 ps (>40 A)
• Up to 80 kW peak output power into 50Ω load
• Built-inHMMpulse up to ±15 kV with 100Ω-configuration
• High pulse output current up to ±80 A (short circuit) with
6 dB reflection suppression
• High speed 50Ω trigger output for oscilloscopes (synchronous
to high voltage pulse output)
• 6 digital programmable pulse rise times: 100 ps to 50 ns
• 8 (optional 9) programmable pulse widths: 0.5 ns (optional),
1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width:
100 ns (0 A to 80 A)
• The optional pulse width extender TLP-3011C enables
pulse width up to 1.6 μs in 68 digital programmable steps
(0 A to 40 A)
• Optional external pulse width extensions from 5 ns to
500 ns (0 A to 80 A) using the external pulse width extender
TLP-8012A5
• Built-in pulse reflection suppression
• Fast measurement time, typically less than 0.2 s per
pulse including one-point DC measurement between
pulses
• Efficient software for system control and waveform data
management
• The software can control automatic probers for fastmeasurements
of complete wafers
• Industrial isolated and protected USB 2.0 interface
• High performance and high quality components
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CAL_KIT_200_A3
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Different values of the reference devices are available on the CAL-KIT-200-A3 calibration kit in order to calibrate the system in the desired voltage and current range where the device under test is to be expected.
Features
• Calibration kit forpackage- orPCBmeasurements
using the adapter PBA-3002A
• 8 reference resistors in the range of 0.2, 0.5, 1, 5,
10, 50, 100 and 500Ωfor calibration of the current
measurement channel
• 5 reference Z-diodes in the range of 5, 7.5, 10, 18
and 33 V for calibration of the voltage measurement
channel
• 1 silicon transient voltage suppressor (TVS) diode
6.8 V for reference measurement of the calibrated
TLP system
• 4 terminals per reference device for Kelvin measurement
• 1 short-circuit test-structure
• Rugged protective case
• Size 76.8mmx 120mmx 20mm
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TLP-12010C
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120 A High Voltage 50 Ω Pulse Generator
Features
- High pulse output current up to 120 A (short circuit)
- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)
- Wafer, package and system level TLP, VF-TLP and HMM testing
- Up to 180 kW peak output power into 50 Ω load
- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)
- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)
- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)
- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6
- Built-in pulse reflection suppression
- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
- Efficient sofware for system control and waveform data management
- The sofware can control automatic probers for fast measurements of complete wafers
- Combines TLP-12010A and TLP-4010C into one system
- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders
- Integrated interlock safety shut-down
- Industrial isolated and EMI/ESD protected USB control interface
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80A High Current TLP/HMM Test System TLP-8010A
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Wafer, package and system level TLP/HMM testing
Fast 50 Ω high voltage pulse output with typically 300 ps rise time
Up to 90 kW peak output power into 50 Ω load
Built-in HMM pulse up to ±16 kV with 100 Ω configuration
High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression
6 GPIB programmable pulse rise times: 300 ps to 50 ns
1 built-in pulse width: 2 ns plus 100 ns with one external charge line cable
Optional external pulse width extensions from 2 ns to 500 ns using the pulse width extender TLP-8012A5
Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
Reverse recovery measurement capabilities in the range of ns up to µs
High-Voltage DMOS SOA measurements
Efficient MATLAB?-based software for system control and waveform data management
The software can control automatic probers for fast measurements of complete wafers
High performance and high quality components
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TLP-12010A
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120 A TLP/HMM Test System
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain.
Features
• High pulse output current up to ±120 A (short circuit)
• Ultra-fast 50Ω high voltage pulse output with typical
300 ps rise time
• Wafer, package and system level TLP and HMM testing
• 180 kW peak output power into 50Ω load
• Built-in HMM pulse up to ±32 kV in 50Ω-configuration
• High speed 50Ω trigger output for oscilloscopes (synchronous
to high voltage pulse output)
• 6 digital programmable pulse rise times out of: 300 ps to
50 ns (optional)
• 1 built-in pulse width: 100 ns
• Optional external pulse width extensions from 5 ns to
500 ns using the external pulse width extender TLP-
12012A6
• Built-in pulse reflection suppression
• Fast measurement time, typically less than 0.2 s per
pulse including one-point DC measurement between
pulses
• Efficient software for system control and waveform data
management
• The software can control automatic probers for fastmeasurements
of complete wafers
• Integrated interlock safety shut-down
• Industrial isolated and EMI/ESD protected USB control
interface
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Pulse Width Extender TLP-8012A5
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Features of the System
- Pulse width extender for the 80A high current TLP/HMM
test system TLP-8010A
- 6 manual selectable pulse width: 5, 10, 50, 100,
200 and 500ns
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TLP-12012A6
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Manual Pulse Width Extender
The pulse width extender TLP-12012A6 is used to extend the pulse with of the TLP-12010A/C high-current TLP/HMM test system from 5 ns, 10 ns, 50 ns, 100 ns, 200 nss up to 500 ns in 6 steps.
Features
• Manual pulse width extender for the high current
TLP/HMM test systems TLP-12010A and TLP-12010C
• 6 manual selectable pulse width: 5, 10, 50, 100, 200 and
500 ns (optional up to 2 μs on request)
• High pulse output current up to ±120 A
• High voltage BNC connectors
• High performance and high quality components
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30A TLP/VF-TLP/HMM Test System TLP-3010C/3011C
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Pulse System TLP-3010C/3011C for the following applications fields:
- ESD robustness characterization on wafer-, chip- and board-level by TLP/vf-TLP/HMM pulse types
- Safe-Operating-Area (SOA) measurements of active and passive devices from 1 ns to 1.6 µs pulse width
- Reverse and forward recovery measurements of diodes from 200 ps to 1 µs
- Breakdown and turn on/off characteristics of devices
- Measurement of the impulse response
Features of the System
- Wafer and system level TLP/VF-TLP/HMM test system
- Ultra fast 50 Ω pulse output with 100 ps rise time
- Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV
- High pulse output current up to ±30 A
- 6 programmable pulse rise-times: 100 ps to 45 ns
- 8 programmable pulse widths: 1 ns to 100 ns
- Optional pulse width extender increases pulse width up to 1.6 µs in 68 GPIB programmable steps
- Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
- Efficient MATLAB?-based software for system control and waveform data management
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TLP-16010A
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4 kV High Voltage Pulse Generator
High voltage pulse generator TLP-16010A including software driver for stand-alone operation
Features
• High voltage transmission line pulse (TLP) generator
• Rectangular pulse shape
• 50Ω high voltage TNC pulse output connector
• ±4 kV output voltage (50Ω output load)
• ±160 A output current (output short circuit)
• 320 kW peak pulse output power into 50Ω load
• 0.6 ns to 50 ns digital programmable pulse rise time in 6 custom selectable steps
• 100 ns pulse width
• Optional Human Metal Model (HMM) pulse shape, equivalent to ±43 kV according IEC 61000-4-2 (330Ω, 150 pF)
• Optional external manual pulse width extender TLP-16012A for 10 ns to 1000 ns pulse width
• 5 Hz pulse repetition frequency
• High speed 50Ω, 1 V trigger output for digital oscilloscopes (synchronous to high voltage pulse output)
• Software driver for stand-alone operation
• Efficient software for system control, waveform analysis and waveform data management (optional)
• Integrated interlock safety shut-down
• Industrial isolated and EMI/ESD protected USB control interface
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80A High Current TLP/VF-TLP/HMM Test System TLP-8010C
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Wafer, package and system level TLP/VF-TLP/HMM testing
Combines TLP-8010A and TLP-3010C into one system
Can be operated together with TLP-8012A5 and TLP-3011C
pulse width extenders
Ultra fast 50 Ω high voltage pulse output with typical rise time
100 ps (0-30 A) and 300 ps (> 30 A)
Up to 90 kW peak output power into 50 Ω load
Built-in HMM pulse up to ±16 kV with 100 Ω configuration
High pulse output current up to ±80 A (short circuit) with
6 dB reflection suppression
High speed 50 Ω trigger output for oscilloscopes
(synchronous to high voltage pulse output)
6 GPIB programmable pulse rise times: 100 ps to 50 ns
8 programmable pulse widths: 1 ns to 100 ns (0-30 A),
1 built-in pulse width: 2 ns (> 30 A)
The optional pulse width extender TLP-3011C enables pulse
width up to 1.6 µs in 68 GPIB programmable steps (0-30 A)
Optional external pulse width extensions from 2 ns to 500 ns
(> 30 A) using the external pulse width extender TLP-8012A5
Fast measurement time, typically 0.5 s per pulse including one-point
DC measurement between pulses
Reverse recovery measurement capabilities in the range of ns up to µs
High-Voltage DMOS SOA measurements
Efficient MATLAB?-based software for system control and waveform data management
The software can control automatic probers for fast measurements of complete wafers
High performance and high quality components
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CMTI-4010C
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The CMTI-4010C is a high voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations
of digital isolators according IEC-60747-5-5 and IEC-60747-17. Fig. 1 shows a typical measurement setup for CMTI evaluation.
Features
• High voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations of digital
isolators according IEC-60747-5-5 and IEC-60747-17
• CMTI slew rate:
a) up to 20 000 V ns−1 at 2 kV at open load output voltage and 100 ps rise time
b) up to 10 000 V ns−1 at 1 kV at 50Ω load output voltage and 100 ps rise time
• 20 kW output power into 50Ω load
• 6 (optional 8) programmable pulse rise times out of:
50 ns, 20 ns, 10 ns, 7 ns, 5 ns, 3.5 ns, 2 ns, 1 ns, 0.6 ns, 300 ps, 200 ps, 100 ps (other values on request)
• Optional automatic software programmable pulse width extensions 125 ns to 1600 ns (up to 2 μs on request) in 25 ns step
size using the external pulse width extender TLP-3011C
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• Built-in pulse reflection suppression
• Fast pulse repetition rate, typically 100 ms per pulse
• Application programming interface (API): software macros to control pulse generator in standalone operation
• Integrated interlock safety shut-down (optional)
• Industrial isolated and EMI/ESD protected USB control interface
• Two years warranty on the total system
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Precision Micromanipulator Kit for TLP/VF-TLP Wafer-Level Measurements PHD-3001A
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Pulse force and pulse sense RF probing solution for TLP/VF-TLP/HMM on-wafer measurements
High peak current capability 80 A (100 ns)
DC - 7 GHz bandwidth
Isolated probe-head ground shield for high pulse sense common mode signal rejection
True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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CAL-04A
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Different values of the reference devices are available on the CAL-04A substrate in order to calibrate the systemin the desired voltage and current range where the device under test is to be expected.
Features
• High quality AlN ceramic substrate for TLP/VFTLP/
HMM/HBM system wafer-level calibration using
ground-signal (GS) RF probes
• Probetip pitch range from 50 μmup to 3mm
• 11 reference resistors in the range of 0.1, 0.2, 0.5,
1, 2, 5, 10, 50, 100, 500Ω(HBM) and 1MΩ(SMU) for
calibration of the current measurement channel
and SMU verification
• 8 reference Z-diodes in the range of 5, 6.5 (TVS),
8.75 (Low-Cap TVS), 10, 20, 30 (Low-Cap TVS), 68
and 120 V for calibration of the voltage measurement
channel
• 1 capacitor 20 pF / 200 V for transient verification1
• 1 inductor 8 nH for transient verification1
• 6 open-load and 6 short-circuit test-structures
• 2 timing de-skew landing-pad structures
• 1 custom reference device position
• Rugged NiCr/Au/Ni/Au top metal
• Laser marked serial number
• Probe pitch verification ruler 100 μm, 200 μm,
300 μm, 400 μm, 500 μm, 600 μm
• Size 24mmx 24mm(fits on AUX chuck)
• Calibration reference data sheet
• Protective case
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CS-0V5-A
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The transformer-based CS-0V5-A pulse current sensor is used to measure the current in a 50Ω transmission line.
Features
• Advanced current sensor for TLP/HMM measurements
• High magnetic Amp x Second rating 70 A μs
• Very fast rise time <150 ps
• 1.5 kHz to >3 GHz bandwidth
• Very low parasitic load impedance 28mΩ (port 1-2)
• 0.5 V/A sensitivity at 50Ω output (port 3)
• Three 50Ω SMA ports
• Compact size: 41mmx 34mmx 16mm
• High reliability
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HBM-SST-10A
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HBM-SST-10A
+/-10 kV Solid-State 2-Pin HBM Pulse Generator
Features
• Solid-State +/-30V to +/-10kV HBM 2-pin tester (ANSI/ESDA/JEDEC JS-001)
• GaN/SiMOS solid-state switching | True HBM - compliant waveforms guaranteed
• Software peak current calibration | Switchable 10k ohm charge removal resistor
• Integrated DUT voltage/current monitoring | DC test DUT switch
• 50 ohm hardware trigger output | Overvoltage protection (oscilloscope/SMU)
• USB control (Industrial isolated EMI/ESD protected)
• Wafer-level & Package-level | 2-wire / 4-wire (Kelvin) measurement
Specifications
• HBM Voltage: +/-30V to +/-10kV (1V step, digital programmable)
• DUT Voltage: +/-1.2kV | DUT Current: +/-6.7A
• Voltage Sense: 1/200 V/V | Current Sense: 1 V/A
• Pulse Rep. Freq: 2~5 Hz | Interface: USB 2.0 (isolated)
• Size: 275 x 175 x 67 mm
Ordering
• HBM-SST-10A: +/-10kV Solid-State 2-Pin HBM Pulse Generator
• HV-CU10-A (Option): 10kV High Voltage Control Unit
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HBM-TS10-A
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ANSI/ESDA/JEDEC JS-001 HBM 2-Pin Tester
• HBM pulse unit HBM-S1-B
• high voltage controller HV-CU10-A
• external DUT-switch S-3000C-LT for 4-wire setup (optional)
• HPPI unified tester software GUI including remote control API
• 1 pcs. 10 dB, 18 GHz SMA attenuator type 18AH-10
• 1 pcs. control cable PCC-200A
• 4 pcs. flexible RG188A/U SMA(m)/SMA(m) 50Ω cable, 2 m, RG188-2m
• 1 pcs. high voltage cable HV10-300A
• 1 pcs. memory stick with software and manuals (16 GB Transcend)
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HBM-SM30-B
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30-pin HBM Tester ANSI/ESDA/JEDEC JS-001
Features
• 30 V to 10 kV HBM matrix tester
according ANSI/ESDA/JEDEC JS-001
• 30-pin switch matrix
• SULLINS FMM15DRKH (2x15 pin) DUT board female
card edge connector at 0.156 " (3.96 mm) pin pitch
• Pogo-pin card edge connector exchange carrier
• DC test (pre/post spots and sweeps)
• Transient HBM current and voltage monitoring
• Industrial USB control interface
• Safety interlock lid
• Switch matrix self test
• Software control, test definition and evaluation:
– Pin map generator
– Test definition and setup, such as
ANSI/ESDA/JEDEC JS-001 table 2A, 2B
– Real-time task view
– Measurement data analysis and storage
• 19"-rack: (W) 553mmx (H) 1333mmx (D) 675mm
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HBM-S1-C
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The HBM-S1-C is a 2-pin HBM test probehead according ANSI/ESDA/JEDEC JS-001 standard with C=100 pF, R=1.5 kΩ discharge network up to ±10 kV. The HBM-S1-C can be used as an optional extension (upgrade on request) for all HPPI TLP-3010C, 4010C,
8010A/C and TLP-12010A/C pulse generators to provide VF-TLP/TLP/HMM and HBM in a single test system.
Features
• ±10 kV Human-Body-Model (HBM) 2-pin tester probehead
according ANSI/ESDA/JEDEC JS-001 standard
with C=100 pF, R=1.5 kΩ discharge network
• Optionally available upgrade for all HPPI TLP-3010C,
4010C, 8010A/C and 12010A/C hardware systems and
software (upgrade on request)
• TrueHBM– the classical discharge network of the HBMS1-
C according the normative standard ensures compliant
waveforms for all load conditions
• Suppression of trailing pulses
• Integrated charge removal resistor
• Integrated DUT voltage and DUT current sensor for real
time voltage and current monitoring
• Integrated DC test DUT switch
• Integrated hardware 50Ω trigger output for high speed
digital oscilloscopes
• Integrated overvoltage protection of voltage sense, current
sense and DC test interfaces for oscilloscope and
SMU protection during high voltage HBM testing
• Fast and efficient HBM measurements including transient
waveform data management using the standard
HPPI TLP software
• Compact size 145mmx 82.5mmx 94mm
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DCT-101500B
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The DCT-101500B is used for DC biasedmeasurements of high voltage or power devices in the time domain (pulsed) or frequency domain (RF).
Features
• High voltage 30 kHz to 8 GHz (−1 dB S21) DC tap
• 1.5 kV DC bias voltage (limited by the SMA connector)
• DC input bias current: max. 2 A DC and max. 10 A pulsed
at 100 ms pulse width and 1%duty cycle
• Typ. 0.4W DC resistance (port 3 to port 1,2)
• SMA 50W thru
• BNC DC input
• Suitable for high voltage DC bias injection or tapping for
measurements in the frequency domain (RF) or time domain
(pulsed)
• Size: 130.6mmx 77.6mmx 31mm
• Lab safety requirement: interlock operation above
an operation voltage of 40 V needed to avoid lifeendangerment
risks.
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HVA-03A
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The attenuator HVA-03A is used to attenuate high voltage pulse signals in a 50Ωline. The device is symmetrical. Input and output can be exchanged.
Features
• 3 dB surge robust attenuator for TLP, HMM and
reverse recovery measurements
• DC - 3.5 GHz bandwidth
• 2.5 kV peak pulse voltage
• SMA interface
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ORTF-0N2
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200 ps Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 200 ps rise time (±10 %)
• better than 15 dB return loss up to 5 GHz
• 3 kV pulse peak voltage
(limited/defined by SMA interface)
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CC-TLP
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The CC-TLP-50-A1 probearm is used for CC-TLP measurements
in order to investigate the CDM performance
of the device under test [1], [2], [3], [4], [5]. For
that purpose the TLP pulse has to have a pulse width
less than 1 ns and a rise time of about typical 100 ps.
DUT voltage and current have to be measured using a
vf-TLP setup.
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Portable Wafer Probe Station PS-5026A
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Portable manual wafer probe station
Electrically isolated chuck with vacuum interface and wafer backside potential connector
80x trinocular stereo zoom microscope
Ultra long-life 20000 lx white LED ring light
High reliability
Low cost
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PS-5026B
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PortableWafer Probe Station
Features
• Portable manual desktop wafer probe station
• Electrically isolated chuck with vacuum interface and
wafer backside potential connector
• Digital microscope camera with C-mount lens
connector, Full-HD 1080p60, 21 MP resolution,
HDMI/USB/microSD interface
• Zoom objective 180x magnification, 7.5x zoom
• 144 LED ring light 6500 K
• Compact size: 500mm(W) x 560mm(D) x 420mm(H)
• High reliability
• Low cost
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PHD-PPM10-H9
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The PHD-PPM10-H9 is a multipurpose, high-performance probe which can be used for VF-TLP/TLP/HMM/HBM force/sense probing as well as general RF measurements using the GGB Picoprobe Model 10 replacement probetips.
Features
• Electrically isolated probearm for VF-TLP, TLP, HMM, HBM force/sense
probing based on the GGB Picoprobe Model 10 replacement probe tips
• Buried coaxial cable channel for thermo-chuck in isolated chamber
temperature measurements
• Compatible with GGB Picoprobe Model 10 replacement probetips
• Compatible with all standard micropositioner interfaces
• High precision rotation of the probearm by backlash-free 80:1 gear
• Rugged stainless steel design
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PHD-4001A
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The PHD-4001A is a multi-purpose, high-performance probe which can be used for VF-TLP/TLP/HMM/HBM force/sense probing,
as well as general RF measurements using the GGB Picoprobe Model 10® replacement probetips.
Features
• Electrically isolated probearm kit for VF-TLP, TLP, HMM, HBM force and sense probing
based on the GGB Picoprobe Model 10® replacement probe tips
• Buried coaxial cable channel for thermo-chuck in isolated chamber temperature
measurements
• Compatible with GGB Picoprobe Model 10® replacement probetips
• Compatible with all standard micropositioner interfaces
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PHD-3001A-FS
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PHD-3001A-FS
GGB Model 10 Force Sensor Probearm Kit
Features
- Pulse force and pulse sense fixed pitch probing solution for TLP/VF-TLP/HMM on-wafer and package-level measurements using GGB’s Picoprobe™ Model 10 probe tips
- Electrically isolated from probe station system ground
- Probe tip touch down force sensors at [mN] resolution
- Precision backlash-free 80:1 manual rotary stage for probe tip alignment
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CMTI-8010C
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CMTI-8010C
High Voltage50 Ω Pulse Generator for CMTI Application
The CMTI-8010C isa high voltage 50 Ω pulse generator for static and dynamic common mode transferinterference (CMTI) evaluations of digital isolators according IEC-60747-5-5and IEC-60747-17.
Features
- High voltage 50 Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations of digital isolators according IEC-60747-5-5 and IEC-60747-17
- Two digital programmable operation modes:
- Mode A: high voltage mode at minimum 0.3 ns pulse rise time
- Mode B: medium voltage mode at minimum 100 ps pulse rise time
- CMTI slew rate:
- up to 10000 V/ns at 3 kV open load output voltage and 0.3 ns rise time (mode A)
- up to 20000 V/ns at 2 kV open load output voltage and 100 ps rise time (mode B)
- 80 kW output power into 50 Ω load (mode A)
- 8 programmable pulse rise times out of: 50 ns, 20 ns, 10 ns, 7 ns, 5 ns, 3.5 ns, 2 ns, 1 ns, 0.6 ns, 0.3 ns, 200 ps, 100 ps (other values on request)
- Optional manual external pulse width extensions from 5 ns to 500 ns (up to 2 µs on request) using the external pulse width extender TLP-8012A5 in mode A up to 3 kV open load output voltage.
- Optional automatic programmable pulse width extensions from 125 ns to 1600 ns (up to 2 µs on request) in 25 ns step size using the external pulse width extender TLP-3011C in mode B up to 2 kV open load output voltage.
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- Built-in pulse reflection suppression
- Fast pulse repetition rate, typically 100 ms per pulse
- Application programming interface (API): software macros to control pulse generator in standalone operation
- Integrated interlock safety shut-down needed for pulse widths beyond 500 ns
- Industrial isolated and EMI/ESD protected USB control interface
- Two years warranty on the total system
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PHD-HMM-48-1
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The PHD-HMM-48-1 is used for the HMM pulse referenced to system ground and can thus be applied on grounded test objects
Features
• High current wafer-level and package-level 98Ω HMM probing with grounded DUT
• Built-in high surge 48Ω pulse reflection suppression resistor up to 80 A peak
• Fast rise time due to low inductance GND loop
• Variable pitch from 50 μmto 5mm
• Tungsten replacement probe tips
• SMA pulse force pigtail
• Compatible to PHD-3001A interface
• High reliability
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AutomatedTestSystem ATS-8000A
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The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP ,HMM and CC-TLP on package-and waferlevel. Future extension for CDM is optional.
The vacuum rotary stage can be configured for any package shape, any package size and wafers.
The probe force sensors ensures maximum probe tip life time and avoid job interruption.
The 3-axis motion systems and rotary stage are designed for ultra-fast speed to maximize throughput.
The user interface and data management is based on HPPI standard software.
Easy to use, rugged high quality components, high throughput.
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TPA-95
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High Voltage TLP Probe Arm Kit
The TPA-95 probe arm kit consits of two probe arms TPA-95L and TPA-95R including tungsten probe tips and interconnection cables.
Features
• Flexible pulse force, pulse sense combined TLP probe
arm kit based on TPA-95L and TPA-95R
• High voltage probing capability: 3 kV up to 1.5 μs pulse
width
• Compatible with typical standard micropositioner mechanical
interfaces (Fig. 11)
• 4.7 kΩ pulse sense voltage divider, which results in a
voltage transfer ratio of (4700 + 50)/50 = 95 : 1 into
50Ω
• Variable probe pitch configuration
• 1m flexible 50Ω cables with SMA connector for pulse
sense
• 0.1mflexible 50Ω cables with SMA connector for pulse
force
• Bracket size custom selectable for HPPI probe station
PS-5026B
• Tungsten probe tips
• Can be used for chuck backside grounded TLP measurements
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DGF-A
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The Flexible Pitch GND Clamp DGF-A is used to interconnect the GND of two separate coaxial probe tips for flexible pitchwafer- or package-level probing usingGGB’s picoprobe model 10 probetips or any other coaxial transmission line, semi-rigid cable with an outer diameter of 0.047 inch (1.1938 mm).
Features
• Compatible with GGB Picoprobe model 10 replacement
probe tips
• Custom wire length: 5mmto 100mm
• Gold-coated spring-steel clamp with micromachined
groove for locking of the clamps on the
probe tip
• High conductivity and low inductance copper HF
litz wire with 200 x Ø 0.02mmstrands
• Easy to use handling
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Sealing Kit PHD-4001-TH-Seal
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• Sealing Kit for PHD-PPM10-H9 on Cascade Octagon CM300 probe station
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HBM-VT
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The HBM-VT is a programmable load impedance for compliance verification of 2-pin human body model (HBM) pulse generators according ANSI/ESDA/JEDEC JS-001 standard with C=100 pF, R=1.5 kΩ discharge network up to ±10 kV.
Features
• HBM pulse generator verification tester according
ANSI/ESDA/JEDEC JS-001 up to ±10 kV
• To be used inHBMtest and qualification labs for regular
pulse generator specification compliance test in order
to fulfill lab audit and certification requirements
• Fully automatic compliance test and verification ofHBM
pulse generators regarding ANSI/ESDA/JEDEC JS-001
normative standard at 3 different load conditions:
1. Short Circuit
2. 500Ω
3. Low capacitance transient voltage suppressor
(TVS) diode type AQ3530-01LTG (Littlefuse) at
VBR = 8.5 V reverse breakdown voltage, including
DC test
• Electrically floating (no fixed system ground)
• Isolated industrial full-speed USB control interface
• Parameter evaluation and verification of the transient
HBM current waveforms:
1. Peak Current
2. Rise Time
3. Decay Time
4. Maximum Ringing Current
• Fully automatic test report generation (PDF, see Fig. 4)
• Optionally available upgrade for all HPPI TLP-3010C,
4010C, 8010A, 8010C, HBM-TS10-A hardware systems in
combination with HBM-S1-B (6 kV) pulse generators
• Built-in current sensor with 1 V/A sensitivty
• Compact size 126mmx 82.5mmx 44.5mm
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HVA-10A
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The attenuator HVA-10A is used to attenuate high voltage pulse signals in a 50Ωline. The device is symmetrical. Input and output can be exchanged.
Features
• 10 dB surge robust attenuator for TLP, HMM and
reverse recovery measurements
• DC - 3 GHz bandwidth
• 2.5 kV peak pulse voltage
• SMA interface
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HVA-10A-TNC
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The attenuator HVA-10A-TNC is used to attenuate high voltage pulse signals in a 50Ω line. The device is symmetrical. Input and output can be exchanged.
Features
• 10 dB high voltage surge robust attenuator
• 4 kV pulse voltage
• DC - 6 GHz bandwidth
• TNC connectors
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HVA-20A
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The attenuator HVA-20A is used to attenuate high voltage pulse signals in a 50Ωline. The device is symmetrical. Input and output can be exchanged.
Features
• 20 dB surge robust attenuator for TLP, HMM and
reverse recovery measurements
• DC - 7 GHz bandwidth
• 2 kV peak pulse voltage
• SMA connectors (optional: N)
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HVA-20A-TNC
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The attenuator HVA-20A-TNC is used to attenuate high voltage pulse signals in a 50Ω line. The device is symmetrical. Input and output can be exchanged.
Features
• 20 dB high voltage surge robust attenuator
• 4 kV pulse voltage
• DC - 6 GHz bandwidth
• TNC connectors
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HVA-34A
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The attenuator HVA-34A is used to attenuate high voltage pulse signals in a 50 Ωline. The device issymmetrical. Input and output can be exchanged.
Features
• 34 dB surge robust attenuator for TLP and HMM measurements
• Voltage attenuation factor k=50
• 2 kV pulse peak input voltage at maximum 1.6 μs pulse width
• SMA interface
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HVA-34A-NFM
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The attenuator HVA-34A-NFM is used to attenuate high voltage pulse signals in a 50Ω line. The device is symmetrical.
Input and output can be exchanged.
Features
• 34 dB surge robust attenuator for TLP and HMM measurements
• 2 kV pulse peak input voltage at maximum 1.6 μs pulse
width
• N female/male interface
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IFB-HF-3002A
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The IFB-HF-3002A can be used as 50Ω DUT interface board for packaged devices and system-level measurements.
Features
• 50Ω DUT interface board with SMA connectors for
TLP, VF-TLP, HMM measurements
• 2-layer FR-4 (1.6mmthick)
• 21.4mmx 66mmsize
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MM-10A
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The MM-10A pulse unit is used for device testing according to JESD22-A115 machine-model (MM) up to 2000 V (MM) by using a TLP system.
Features
• Pulse unit to generate JESD22-A115 machinemodel
(MM) waveforms with TLP
• Extremely stable and reproducible machinemodel
(MM) waveforms
• Compatible with HPPI TLP-3010C/4010C/8010A/
8010C systems which have installed pulse width of
25 ns and rise time of 100 ps to 300 ps
• Up to ±10 A machine-model peak current with
TLP-3010C, which is equivalent to ±667 V (MM)
• Up to ±15 A machine-model peak current with
TLP-4010C, which is equivalent to ±1000 V (MM)
• Up to ±30 A machine-model peak current with
TLP-8010A and TLP-8010C, which is equivalent to
±2000 V (MM)
• Same measurement procedure as TLP including
DC test of the DUT
• Compatible with HPPI TLP software andwaveform
data storage and management
• 50Ω SMA input and output connectors
• Compact size: 61mmx 25mmx 17mm
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ORTF-0N3
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300 ps Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 300 ps rise time (±10 %)
• better than 20 dB return loss up to 5 GHz
• 3 kV pulse peak voltage
(limited/defined by SMA interface)
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ORTF-0N5
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500 ps Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 500 ps rise time (±10 %)
• better than 20 dB return loss
• 2 kV pulse peak voltage
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ORTF-1
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1 ns Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 1 ns rise time (±10 %)
• better than 15 dB return loss
• 2.5 kV pulse peak voltage
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ORTF-5
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5 ns Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 5 ns rise time (±10 %)
• better than 20 dB return loss up to 1 GHz
• 2.5 kV pulse peak voltage
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ORTF-10
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10 ns Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 10 ns rise time (±10 %)
• better than 20 dB return loss up to 500 MHz
• 3.15 kV pulse peak voltage
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ORTF-20
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20 ns Rise Time Filter
Features
• 50Ω rise time filter for TLP measurements
• 20 ns rise time (±10 %)
• better than 23 dB return loss
• up to 3.2 kV pulse peak voltage
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ORTF-25
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25 ns Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 25 ns (±10 %) rise-time
• up to 100 A pulse peak current
• up to 3.5 kV pulse peak voltage
• SMA connectors
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ORTF-50
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Rise-Time Filter 50 ns
Features
• 50Ω Rise-Time Filter for TLP Measurements
• Typ. 50 ns Rise-Time
• Return Loss <−18 dB
• Up to 3 kV Pulse Peak Voltage
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ORTF-100
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100 ns Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 100 ns (±5 %) rise-time
• up to 100 A pulse peak current
• up to 3.5 kV pulse peak voltage
• SMA connectors
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ORTF-200
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200 ns Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 200 ns (±10 %) rise-time
• 60 A pulse peak current at 1.6 μs pulse width
• 3.5 kV pulse peak voltage
• SMA connectors
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ORTF-250
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250 ns Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 250 ns (±10 %) rise-time
• 60 A pulse current up to 1.6 μs pulse width
• 2.5 kV
• SMA connectors
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ORTF-1000
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1000 ns Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 1000 ns (±10 %) rise-time
• 15 A pulse current
• 2.5 kV pulse voltage
• SMA connectors
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ORTF-1200
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1.2 μs Rise-Time Filter
Features
• 50Ω rise-time filter for TLP measurements
• 1.2 μs (±10 %) rise-time
• 32 A pulse current
• 2.5 kV
• SMA connectors
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S-4000A-LT
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18 GHz Low Triboelectric Switch
The S-4000A-LT is used to connect two different measurement setup with a TLP or VF-TLP system.
Features
• 3 synchronous switched single pole, double throw
(SP2T) channels.
• All channels have very low triboelectricity
• DC - 18 GHz bandwidth
• Suitable for high performance VF-TLP
• 9 SMA interfaces
• Integrated sheath wave (common mode) suppression
by ferrite cores
• 12 V, 600mA dual control interface, connected in parallel.
Pin-compatible with the standard S-3000CK switch
interface of the TLP-3010C/4010C/8010A/8010C systems.
• Size 172mmx 83mmx 51mm
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S-3000DK
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3 kV, 9 GHz DUT Switch For TLP-12010A/C Pulser
The S-3000DK is used to connect the device under test (DUT) with the measurement system.
Features
• DUT switch for 120 A TLP-12010A/C systems at 3 kV
pulse voltage into 50Ω
• 2 synchronous switched single pole, double throw
(SP2T) channels
• Integrated sheath wave (common mode) suppression
• DC - 9 GHz bandwidth
• 3 kV nominal pulse voltage
• Designed for high performance VF-TLP/TLP/HMM
• Suitable for “quasi”-Kelvin DC test
• 6 SMA ports
• 12 V, 550mA power consumption
• Size 129.1mmx 82.4mmx 45.5mm
• 2 x Ø 4mm dowel holes and 2 x M4 threads on bottom
for system integration (Fig. 5)
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S-3000CK
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2 kV, 18 GHz DUT Switch
The S-3000CK is used to connect the device under test (DUT) with the measurement system.
Features
• DUT switch for 30 A to 80 A, TLP-3010C, TLP-4010C and
CMTI/TLP-8010A/C
• 2 synchronous switched single pole, double throw
(SP2T) channels
• Integrated sheath wave (common mode) suppression
• DC - 18 GHz bandwidth
• 2 kV nominal pulse voltage
• Designed for high performance VF-TLP/TLP/HMM
• Suitable for “quasi”-Kelvin DC test
• 6 SMA ports
• 12 V, 550mA power consumption
• Size 129.1mmx 82.4mmx 45.5mm
• 2 x Ø 4mm dowel holes and 2 x M4 threads on bottom
for system integration (Fig. 5)
• Extremely low triboelectricity generation
• Improved reliability for high system pulse counts
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S-30ps
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30 ps Rise-Time Pulse Module
The S-30ps is a stand-alone pulse module for advanced VF-TLP application.
Features
• 30 ps rise time pulse module for advanced VF-TLP
and CC-TLP application
• 500 ps pulse width (customizable e.g. 100 ps)
• Wide voltage range:
sub-1 V to 1 kV pulse output voltage into 50Ω
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PT-95A
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50Ω SMA Wideband Pick-Off Tee
The wideband pick-off tee can be used to measure the voltage amplitude of incident and reflected waves in a 50Ω transmission line.
• Wideband pick-off tee for CMTI and TLP measurements
• General purpose voltage probe 95:1
• Nominal pick-off transfer coefficient −39.55 dB
• DC to 5 GHz bandwidth (3 dB S31, S32)
• Insertion loss typ. 0.2 dB (S21) at 5 GHz
• max. 2.5 kV peak pulse voltage (1.6 μs pulse width)
• max. 15 V DC (port 1, port 2 to port 3)
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PT-45A
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50Ω SMA Wideband Pick-Off Tee
The wideband pick-off tee can be used tomeasure the voltage amplitude of incident and reflectedwaves in a 50Ω transmission line.
• Wideband pick-off tee for TLP/VF-TLP measurements
• General purpose voltage probe 45:1
• Nominal pick-off transfer coefficient −33 dB
• DC to 10 GHz bandwidth (±2 dB)
• Insertion loss typ. 0.2 dB at 5 GHz
• max. 2.5 kV peak pulse voltage (1.6 μs pulse width)
• max. 10 V DC (port 1, port 2 to port 3)
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LT50-A
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Dual 50Ω High Voltage Load Termination Resistor
Features
• Dual 50Ω high voltage pulse termination resistor
• SMA connectors
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BT-10100B
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The BT-10100B is used for DC biased TLP, VF-TLP,HMMor general
RF measurements of high voltage and power devices in
the time domain or frequency domain.
Features
• High voltage 30 kHz to 7 GHz (−1 dB S21) bias tee
• 100 V DC bias voltage
• DC input bias current: max. 2 A DC and max. 10 A pulsed
at 100 ms pulse width and 1%duty cycle
• Typ. 0.4Ω DC resistance (port 3 to port 2)
• SMA 50Ω pulse input and 50Ω DC/pulse output
• BNC DC input
• Suitable for high-current TLP, VF-TLP and HMM
• Size: 130.6mmx 77.6mmx 31mm
• Lab safety requirement: interlock operation above
an operation voltage of 40 V needed to avoid lifeendangerment
risks.
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TLP-12010A
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High Voltage 50 Ω Pulse Generator
Features
- High pulse output current up to ±120 A (short circuit)
- Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time
- Wafer, package and system level TLP and HMM testing
- 180 kW peak output power into 50 Ω load
- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)
- 1 built-in pulse width: 100 ns
- Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6
- Built-in pulse reflection suppression
- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
- Efficient software for system control and waveform data management
- The software can control automatic probers for fast measurements of complete wafers
- Integrated interlock safety shut-down
- Industrial isolated and EMI/ESD protected USB control interface
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HBM-S1-B
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The HBM-S1-B is a 2-pin HBM test probehead according ANSI/ESDA/JEDEC JS-001 standard with C=100 pF, R=1.5 kΩ discharge network up to ±6 kV. The HBM-S1-B can be used as an optional extension (upgrade on request) for all HPPI TLP-3010C, 4010C, 8010A/C, and TLP-12010A/C pulse generators to provide VF-TLP/TLP/HMM and HBM in a single test system.
Features
• ±6 kV Human-Body-Model (HBM) 2-pin tester probehead
according ANSI/ESDA/JEDEC JS-001 standard
with C=100 pF, R=1.5 kΩ discharge network
• Optionally available upgrade for all HPPI TLP-3010C,
4010C, 8010A/C, and TLP-12010A/C hardware systems
and software (upgrade on request)
• TrueHBM– the classical discharge network of the HBMS1-
B according the normative standard ensures compliant
waveforms for all load conditions
• Suppression of trailing pulses
• Integrated charge removal resistor
• Integrated DUT voltage and DUT current sensor for real
time voltage and current monitoring
• Integrated DC test DUT switch
• Integrated hardware 50Ω trigger output for high speed
digital oscilloscopes
• Integrated overvoltage protection of voltage sense, current
sense and DC test interfaces for oscilloscope and
SMU protection during high voltage HBM testing
• Fast and efficient HBM measurements including transient
waveform data management using the standard
HPPI TLP software
• Compact size 145mmx 82.5mmx 44mm
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HVA-06B
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The attenuator HVA-06B is used to attenuate high voltage pulse signals in a 50 line. The device is symmetrical. Input and output can be exchanged.
Features
6 dB surge robust attenuator for TLP, HMM and
reverse recovery measurements
DC - 3.5 GHz bandwidth
2.5 kV peak pulse voltage
SMA interface
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CMTI-3010C
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The CMTI-3010C is a high voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations
of digital isolators according IEC-60747-5-5 and IEC-60747-17. Fig. 1 shows a typical measurement setup for CMTI evaluation.
Features
• High voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations of digital
isolators according IEC-60747-5-5 and IEC-60747-17
• CMTI slew rate:
a) up to 15 000 V ns−1 at 1.5 kV at open load output voltage and 100 ps rise time
b) up to 7500 V ns−1 at 750 V at 50Ω load output voltage and 100 ps rise time
• 11 kW output power into 50Ω load
• 6 (optional 8) programmable pulse rise times out of:
50 ns, 20 ns, 10 ns, 7 ns, 5 ns, 3.5 ns, 2 ns, 1 ns, 0.6 ns, 300 ps, 200 ps, 100 ps (other values on request)
• Optional automatic software programmable pulse width extensions 125 ns to 1600 ns (up to 2 μs on request) in 25 ns step
size using the external pulse width extender TLP-3011C
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• Built-in pulse reflection suppression
• Fast pulse repetition rate, typically 100 ms per pulse
• Application programming interface (API): software macros to control pulse generator in standalone operation
• Integrated interlock safety shut-down (optional)
• Industrial isolated and EMI/ESD protected USB control interface
• Two years warranty on the total system
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VF-TLP-PD-06A
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The VF-TLP-PD-06A is a high-voltage two-resistor type 6 dB power splitter which can be used for VF-TLP measurements.
Features
• 6 dB power splitter
• 2 kV (VF-TLP)
• DC to 9 GHz bandwidth
• SMA connectors
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TLP System Interlock Safety Shutdown ILK
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The interlock safety shut down function of the TLPxxx10A/C high voltage pulse generators is used to disable the pulse output for safety shutdown.
If the pulse output has been disabled by the interlock circuit, the internal high voltage power supply is disconnected and the red pulse LED on the front panel does not flash.
Features
• Interlock safety shutdown for TLP-xxx10A/C high voltage pulse generators
• Works with external standalone interlock hardware switch (option 1) or interlock control voltage (option 2)
• Compatible with Keithley SMU interlock interface
• Note: the TLP system does not operate unless the interlock is connected properly
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TB-50/SMA
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50Ω DUT Board
The TB-50/SMA DUT board can be used for TLP measurement of packaged devices in a 50Ω system.
Features
• 50Ω DUT Board with SMA interface
for TLP measurement of packaged devices
• DUT pad pitch range from 0.5mm up to 25mm with
excellent RF performance due to grounded coplanar
transmission line design and GND via array
• ROGERS high frequency RO4003C, 0.032 ” (0.813 mm)
thick hydrocarbon ceramic laminate
• Gold-plated
• typ. 0.2 dB at 3 GHz insertion loss
• 30mmx 14mmsize
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PBA-3002B
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The PBA-3002B can be used as 50ΩDUT interface board for packaged devices and system-level measurements.
Features
• 50Ω DUT interface board with SMA connectors for
TLP, VF-TLP, HMM measurements
• 2-layer FR-4 (1.6mmthick)
• 21.4mmx 66mmsize
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HIT-526A
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High Impedance Transformer (50Ω to 526Ω)
Features
• Combined switch for 50Ω and 526Ω standard and high
impedance TLP measurements
• SMA interface
• SMA-to-cable interface (optional)
• DC to 2.8 GHz (−3 dB) 50Ω bandwidth (at SMA interfaces)
• Controlled automatically by the TLP software
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BT-101000B
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The BT-101000B is used for DC biased TLP, VF-TLP, HMM or
general RF measurements of high voltage and power devices
in the time domain or frequency domain.
Features
• High voltage 30 kHz to 4 GHz (−1 dB S21) bias tee
• 1 kV DC bias voltage
• DC input bias current: max. 2 A DC and max. 10 A pulsed
at 100 ms pulse width and 1%duty cycle
• Typ. 0.4Ω DC resistance (port 3 to port 2)
• SMA 50Ω pulse input and 50Ω DC/pulse output
• BNC DC input
• Suitable for high-current TLP, VF-TLP and HMM
• Size: 130.6mmx 77.6mmx 31mm
• Lab safety requirement: interlock operation above
an operation voltage of 40 V needed to avoid lifeendangerment
risks.
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CAL-03A
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Different values of the reference devices are available on the CAL-03A substrate in order to calibrate the systemin the desired voltage and current range where the device under test is to be expected.
Features
• High quality AlN ceramic substrate for TLP/VFTLP/
HMM/HBM system wafer-level calibration using
ground-signal (GS) RF probes
• Probetip pitch range from 50 μmup to 3mm
• 11 reference resistors in the range of 0.1, 0.2, 0.5,
1, 2, 5, 10, 50, 100, 500Ω and 1MΩ for calibration
of the current measurement channel and SMU
verification
• 8 reference Z-diodes in the range of 5, 6.5 (TVS),
8.75 (Low-Cap TVS), 10, 20, 30 (Low-Cap TVS), 68
and 120 V for calibration of the voltage measurement
channel
• 6 open-load and 6 short-circuit test-structures
• 2 timing de-skew landing-pad structures
• 3 custom reference device positions
• Rugged NiCr/Au/Ni/Au top metal
• Laser marked serial number
• Probe pitch verification ruler 100 μm, 200 μm,
300 μm, 400 μm, 500 μm, 600 μm
• Size 24mmx 24mm(fits on AUX chuck)
• Calibration data sheet
• Protective case
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CMTI-8010A
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The CMTI-8010A is a high voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations
of digital isolators according IEC-60747-5-5 and IEC-60747-17.
Features
• High voltage 50Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations of digital
isolators according IEC-60747-5-5 and IEC-60747-17
• 10 000 V ns−1 CMTI slew rate at 3 kV open load output voltage and 0.3 ns rise time
• 80 kW output power into 50Ω load
• 8 programmable pulse rise times out of: 20 ns, 10 ns, 7 ns, 5 ns, 3.5 ns, 2 ns, 1 ns, 0.6 ns, 0.3 ns. Other values on request.
• 100 ns pulse width
• Optional external pulse width extensions from5 ns to 500 ns (up to 2 μs on request) using the external pulse width extender
TLP-8012A5
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• Built-in pulse reflection suppression
• 200 ms pulse repetition rate
• Application programming interface (API): software macros to control pulse generator in standalone operation
• Integrated interlock safety shut-down needed for pulse widths beyond 500 ns
• Industrial isolated and EMI/ESD protected USB control interface
• Two years warranty on the total system
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VC200A
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Vacuum Chuck
The VC200A can be used in two configurations as microporous vacuum chuck or as metal vacuum chuck with grooves by exchange of the top plate.
Features
• 200mmvacuum chuck
• Custom configurable:
a) microporous vacuum chuck
b) metal vacuum chuck with grooves
• Two vacuum ports: side, bottom center
• Can be used stand-alone
• Compatible with Alio rotary stage (optional)
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F140
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The F140 is used to seal the chuck vacuum of the PS-5026B probe station. This is useful if small devices (not wafers) indented to be fixed on the chuck.
Features
• Chuck vacuum seal film for the PS-5026B probe
station
• 0.1mmthick polyethylene terephthalate film
• 140mmouter diameter
• Different cutout inner diameters available
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TVS-70MF-10
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Transient Voltage Suppressor
The TVS-70MF-10 transient voltage suppressor can be used to protect sensitive high speed oscilloscope inputs against possibly too high input overload from high voltage pulse generators or IEC ESD guns.
Features
• Input overload protection for 50Ω high speed oscilloscopes
and other RFmeasurement equipment up to 2 kV
input voltage in 50Ω (100 ns pulse width)
• Suitable for standard TLP, HMM, HBM
Note: for VF-TLP, CC-TLP use TVS-5VRR (see Sect. 3.4)
• Can be used for protection up to ±25 kV according
IEC 61000-4-2 (contact discharge)
• DC to 6 GHz (−1 dB) bandwidth
• DC working voltage range max. ±5 V (at 27 °C)
• Clamping voltage typ. 41 V at 2 kV (50Ω) or 74 A input
overload (100 ns pulse width)
• Insertion loss typ. 0.2 dB at 1 GHz
• Return loss typ. 25 dB at 1 GHz
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Company Profile
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High Power Pulse Instruments GmbH (HPPI) is a supplier of ESD
measurement equipment based on advanced Transmission Line Pulse
(TLP) techniques.
Our products enable the characterization of semiconductor devices and
circuits in the pulsed high current and high voltage time domain.
The development of our systems has profited largely from the knowledge
gained over 15 years in the development of semiconductor devices, i
ntegrated high speed and radio frequency circuits and ESD protection
techniques for the semiconductor industry.
Our products combine standard TLP, very fast TLP and Human Metal
Model (HMM) in a single test system to cover most of today's ESD characterization
needs.
What is TLP testing: 아래 데이터 시트를 클릭 해주세요.
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